DocumentCode :
1951647
Title :
Ultra-low-voltage robust design issues in deep-submicron CMOS
Author :
Vladimirescu, Andrei ; Cao, Yu ; Thomas, Olivier ; Qin, Huifang ; Markovic, Dejan ; Valentian, Alexandre ; Ionita, Razvan ; Rabaey, Jan ; Amara, Amara
Author_Institution :
California Univ., Berkeley, CA, USA
fYear :
2004
fDate :
20-23 June 2004
Firstpage :
49
Lastpage :
52
Abstract :
Design challenges for operating CMOS circuits fabricated in 0.13 μm and finer technologies at ultra-low-voltages are analyzed. The design goal consists in minimizing energy by reducing VDD while maintaining delay and yield at acceptable levels in the presence of increasing variability of process parameters. First, an estimation model developed to accurately predict operation of bulk- and SOI-CMOS in subthreshold is described. The relation between yield, energy, delay and device parameter distributions is examined next along with tradeoffs necessary to achieve the desired performance point. The main objective of minimizing energy is explored for SRAM cells by predicting the minimum VDD based on the data-retention voltage (DRV), and acceptable signal-to-noise margins (SNM). Experimental data from a 4 kB-SRAM test chip in 0.13 μm CMOS are presented demonstrating a 90% leakage reduction potential in standby under reduced bias of 250 mV.
Keywords :
CMOS memory circuits; Monte Carlo methods; SRAM chips; elemental semiconductors; estimation theory; integrated circuit design; low-power electronics; silicon-on-insulator; 0.13 micron; 250 mV; 4 kB; Monte Carlo methods; SOI CMOS circuits; SRAM cells; SRAM test chip; bulk CMOS circuits; data retention voltage; deep submicron CMOS technology; energy minimization; leakage reduction potential; signal-to-noise margin; static noise margin; subthreshold estimation model; ultra low voltage robust design; CMOS technology; Circuits; Delay; Parameter estimation; Predictive models; Random access memory; Robustness; Semiconductor device modeling; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2004. NEWCAS 2004. The 2nd Annual IEEE Northeast Workshop on
Print_ISBN :
0-7803-8322-2
Type :
conf
DOI :
10.1109/NEWCAS.2004.1359013
Filename :
1359013
Link To Document :
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