DocumentCode
1951665
Title
SOI technology for future SoC
Author
Inoue, Yasuo
Author_Institution
ULSI Dev. Center, Mitsubishi Electr. Corp., Hyogo, Japan
fYear
2002
fDate
2-3 Dec. 2002
Firstpage
107
Lastpage
108
Abstract
SOI CMOS devices have been investigated for a long time and as the quality of SOI wafers has been improved as the same level of bulk-Si wafers and improvement of the speed performance of CMOS devices is becoming difficult, they have entered the phase of practical use. There are two approaches for the usage of SOI CMOS. One approach is the SOI CMOS in floating-body structure and the other is the one in body-tied structure. In the case of body-tied structure it is possible to realize the layout with the bulk-Si compatibility and to suppress the history effect due to the floating body structure. To keep the compatibility of bulk-Si CMOS technology, we developed the hybrid trench technology, which realizes the body-tied structure for each transistor and full isolation between NMOS and PMOS transistors.
Keywords
MOSFET; elemental semiconductors; isolation technology; silicon; silicon-on-insulator; system-on-chip; NMOS transistors; PMOS transistors; SOI CMOS devices; Si; Si wafers; body tied structure; floating body structure; hybrid trench technology; isolation; system on chip; CMOS technology; Capacitance; Circuits; Delay; History; Isolation technology; MOS devices; MOSFETs; Threshold voltage; Ultra large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Junction Technology, 2002. IWJT. Extended Abstracts of the Third International Workshop on
Conference_Location
Tokyo, Japan
Print_ISBN
4-89114-028-3
Type
conf
DOI
10.1109/IWJT.2002.1225217
Filename
1225217
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