• DocumentCode
    1951665
  • Title

    SOI technology for future SoC

  • Author

    Inoue, Yasuo

  • Author_Institution
    ULSI Dev. Center, Mitsubishi Electr. Corp., Hyogo, Japan
  • fYear
    2002
  • fDate
    2-3 Dec. 2002
  • Firstpage
    107
  • Lastpage
    108
  • Abstract
    SOI CMOS devices have been investigated for a long time and as the quality of SOI wafers has been improved as the same level of bulk-Si wafers and improvement of the speed performance of CMOS devices is becoming difficult, they have entered the phase of practical use. There are two approaches for the usage of SOI CMOS. One approach is the SOI CMOS in floating-body structure and the other is the one in body-tied structure. In the case of body-tied structure it is possible to realize the layout with the bulk-Si compatibility and to suppress the history effect due to the floating body structure. To keep the compatibility of bulk-Si CMOS technology, we developed the hybrid trench technology, which realizes the body-tied structure for each transistor and full isolation between NMOS and PMOS transistors.
  • Keywords
    MOSFET; elemental semiconductors; isolation technology; silicon; silicon-on-insulator; system-on-chip; NMOS transistors; PMOS transistors; SOI CMOS devices; Si; Si wafers; body tied structure; floating body structure; hybrid trench technology; isolation; system on chip; CMOS technology; Capacitance; Circuits; Delay; History; Isolation technology; MOS devices; MOSFETs; Threshold voltage; Ultra large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Junction Technology, 2002. IWJT. Extended Abstracts of the Third International Workshop on
  • Conference_Location
    Tokyo, Japan
  • Print_ISBN
    4-89114-028-3
  • Type

    conf

  • DOI
    10.1109/IWJT.2002.1225217
  • Filename
    1225217