DocumentCode :
1951698
Title :
Distributed control in testable high-level synthesis with low area and power overhead
Author :
Harmanani, Haidar ; Marrouche, Wissam
Author_Institution :
Dept. of Comput. Sci., Lebanese American Univ., Byblos, Lebanon
fYear :
2004
fDate :
20-23 June 2004
Firstpage :
65
Lastpage :
68
Abstract :
This work presents a method for distributed test control in coordination with testable data path allocation in high-level synthesis. The method aims at creating distributed test controllers for synthesized data paths with the aim of minimizing area and power consumption. The distributed controllers are designed to be small and mounted next to their corresponding test kernels. Thus, every test kernel in the datapath has its own test controller in addition to a relatively small controller that synchronizes the distributed controllers. The system has been implemented using C++ and favorable results are reported.
Keywords :
C++ language; circuit testing; control system synthesis; distributed control; high level synthesis; power consumption; C++ language; data path allocation; distributed controller design; distributed test control; high level synthesis; power consumption; Automatic control; Built-in self-test; Circuit synthesis; Circuit testing; Clocks; Control system synthesis; Distributed control; High level synthesis; Kernel; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2004. NEWCAS 2004. The 2nd Annual IEEE Northeast Workshop on
Print_ISBN :
0-7803-8322-2
Type :
conf
DOI :
10.1109/NEWCAS.2004.1359018
Filename :
1359018
Link To Document :
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