DocumentCode :
1951790
Title :
Molecularly derived mesoscale modeling of an epoxy/Cu interface (part III*): Interface roughness
Author :
Iwamoto, Nancy
Author_Institution :
Honeywell Specialty Mater., USA
fYear :
2012
fDate :
16-18 April 2012
Firstpage :
42377
Lastpage :
42590
Abstract :
This paper addresses use of coarse-grained mesoscale model to look at angle dependencies in an epoxy-copper (I) oxide interface in order to understand roughness effects on adhesion. The parameterization of the coarse-grained beads were previously parameterized from the molecular level [1-3] for the same polymer and copper oxide interface. Roughness was investigated in two ways: applying a zigzag interface to the interface separation simulation, and separating the interface using differing angles. When compared, both methods reduce to the similar energy trends. In addition, the effect moisture on the interface was compared for the rough and smooth interfaces.
Keywords :
adhesion; copper compounds; molecular dynamics method; polymers; resins; surface roughness; CuO; adhesion; coarse-grained beads; coarse-grained mesoscale model; epoxy-copper oxide interface; interface roughness; interface separation simulation; molecularly derived mesoscale modeling; polymer; zigzag interface; Delamination; Polymers; Strain;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2012 13th International Conference on
Conference_Location :
Cascais
Print_ISBN :
978-1-4673-1512-8
Type :
conf
DOI :
10.1109/ESimE.2012.6191702
Filename :
6191702
Link To Document :
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