• DocumentCode
    1951806
  • Title

    A system for measuring surface facet orientation from atomic force microscope data

  • Author

    Hagedorn, John ; Rushmeier, Holly ; Blendell, John ; Vaudin, Mark

  • Author_Institution
    Comput. & Appl. Math. Lab., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • fYear
    1996
  • fDate
    Oct. 27 1996-Nov. 1 1996
  • Firstpage
    397
  • Lastpage
    400
  • Abstract
    The authors describe a graphical system developed for researchers in materials science for extracting information from data obtained by atomic force microscopy. In particular, they consider the problem of computing surface orientations from data obtained from ceramic materials. The visualization problems they consider in designing this system include finding useful mechanisms for the researcher to interact with the data, presenting results in forms familiar to the scientist, and enhancing traditional display techniques.
  • Keywords
    microscopy; atomic force microscope data; ceramic materials; data interaction; display techniques; graphical system; information extraction; materials science; results presentation; surface facet orientation measurement; surface orientation computation; Atomic force microscopy; Atomic measurements; Data mining; Data visualization; Force measurement; Laboratories; Materials science and technology; Probes; Shape; Surface morphology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Visualization '96. Proceedings.
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-89791-864-9
  • Type

    conf

  • DOI
    10.1109/VISUAL.1996.568141
  • Filename
    568141