Title :
Computer-aided test flow in core-based design
Author :
Zivkovic, V.A. ; Tangelder, R.J.W.T. ; Kerkhoff, H.G.
Author_Institution :
MESA Res. Inst., Twente Univ., Enschede, Netherlands
Abstract :
This paper copes with the test-pattern generation and fault coverage determination in the core based design. The basic core-test strategy that one has to apply in the core-based design is stated in this work. A Computer-Aided Test (CAT) flow is proposed resulting in accurate fault coverage of embedded cores. The CAT now is applied to a few cores within the Philips Core Test Pilot IC project
Keywords :
automatic test pattern generation; circuit CAD; design for testability; integrated circuit design; integrated circuit testing; Philips Core Test Pilot IC; computer-aided test flow; core-based design; embedded core; fault coverage; test pattern generation; Buildings; Circuit faults; Circuit testing; Cows; Design engineering; Design for testability; Integrated circuit testing; Manufacturing; Pins; Test pattern generators;
Conference_Titel :
Microelectronics, 2000. Proceedings. 2000 22nd International Conference on
Conference_Location :
Nis
Print_ISBN :
0-7803-5235-1
DOI :
10.1109/ICMEL.2000.838790
