DocumentCode
1952065
Title
An extensive investigation of the four point bending test for interface characterization
Author
Noijen, S.P.M. ; van der Sluis, O. ; Timmermans, P.H.M.
Author_Institution
Philips Res., Eindhoven, Netherlands
fYear
2012
fDate
16-18 April 2012
Firstpage
42378
Lastpage
42622
Abstract
This paper focuses on metal-polymer interfaces that cover a wide range of all critical interfaces in the micro-electronic industry. Interface characterization is performed for two types of copper/epoxy molding compound (EMC) interfaces on a four point bending setup. The force-displacement curves for the type 1 interface show a clear force plateau indicating steady delamination propagation along the interface. The interface properties for this measurement can be calculated analytically from the steady-state part of the curve. Transient calculations on a 2D plane strain finite element model including cohesive zone elements show that the effect of intrinsic thermal stresses due to processing on the resulting force-displacement curve is apparent. The force-displacement curves for the type 2 samples do not show a clear force plateau. The deformation of the samples clearly shows this can be attributed to non-linear effects that are not considered in the analytical stead-state solution. The influence of the main contributors to nonlinear behavior, such as plasticity, large deformations, and contact at the supports is investigated. The quantification of these effects by FE analysis results in a better understanding of the force-displacement curve for the type 2 samples.
Keywords
bending; finite element analysis; force; integrated circuit testing; interface structure; metals; moulding; plasticity; polymers; thermal stresses; 2D plane strain finite element model; EMC interface; FE analysis; cohesive zone element; copper/epoxy molding compound; deformation; force plateau; force-displacement curve; four point bending test; interface characterization; interface properties; intrinsic thermal stress; metal-polymer interface; microelectronic industry; nonlinear behavior; nonlinear effect; plasticity; steady delamination propagation; Copper; Electromagnetic compatibility; Face; Iron; Materials;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2012 13th International Conference on
Conference_Location
Cascais
Print_ISBN
978-1-4673-1512-8
Type
conf
DOI
10.1109/ESimE.2012.6191714
Filename
6191714
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