DocumentCode :
1952235
Title :
Using partial reconfiguration and high-level models to accelerate FPGA design validation
Author :
Iskander, Y. ; Craven, S. ; Chandrasekharan, Anupama ; Rajagopalan, Satish ; Subbarayan, Ganesh ; Frangieh, T. ; Patterson, C.
Author_Institution :
Secure Comput. & Commun., Luna Innovations Inc., Roanoke, VA, USA
fYear :
2010
fDate :
8-10 Dec. 2010
Firstpage :
341
Lastpage :
344
Abstract :
Design validation is the most time-consuming task in the FPGA design cycle. Although manufacturers and third-party vendors offer a range of tools that provide different perspectives of a design, many require that the design be fully re-implemented for parameter modifications or do not allow the design to be run at full-speed. Designs are frequently first modeled using a high-level language then later rewritten in a hardware description language, first for simulation and then later modified for synthesis. IP and third-party cores may differ during these final two stages complicating development and validation. Our approach provides a means of directly validating synthesized hardware designs with the original high-level model, abstracting away the traditional bit-level view of designs. The Dynamic Modular Development (DMD) framework accelerates module turnaround by reusing floorplans and placing frequently changing modules into separate, partially reconfigurable regions. The debug framework also leverages these reconfigurable regions to accelerate the modification of dynamic, software-like breakpoints for low-level analysis.
Keywords :
field programmable gate arrays; logic design; FPGA design validation; debug framework; dynamic modular development framework; hardware description language; high-level language; high-level models; partial reconfiguration; Clocks; Debugging; Field programmable gate arrays; Hardware; Hardware design languages; Registers; Software;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Field-Programmable Technology (FPT), 2010 International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-8980-0
Type :
conf
DOI :
10.1109/FPT.2010.5681432
Filename :
5681432
Link To Document :
بازگشت