Characteristics of shielded microstrip with finite conductivity and finite strip thickness

Author

El-Hennawy, Adel E. ; El-Minyawi, Nagda M H ; Al-Saeed, Tarek A.

Author_Institution

Fac. of Eng., Ain Shams Univ., Cairo, Egypt

fYear

2000

fDate

2000

Abstract

An accurate full-wave mode matching approach is used to analyze the dispersion characteristics of shielded microstrip. In contrast to the usual perturbation method it includes metallic loss by a self-consistent description without skin effect approximation. The analysis holds for arbitrary high losses and also for metallization dimensions smaller than the skin depth. The metallic strip is considered to be of finite conductivity with finite metallization thickness. The substrate used is GaAs

Keywords

dispersion (wave); electrical conductivity; inhomogeneous media; losses; metallisation; microstrip lines; mode matching; shielding; skin effect; waveguide theory; GaAs; III V semiconductor; MMIC; dispersion characteristics; finite conductivity; finite metallization thickness; finite strip thickness; full-wave mode matching; high losses; metallic loss; metallic strip; metallization dimensions; perturbation method; shielded microstrip characteristics; skin depth; substrate; Conductivity; Conductors; MMICs; Metallization; Microstrip; Perturbation methods; Region 1; Region 2; Skin; Strips;

fLanguage

English

Publisher

ieee

Conference_Titel

Radio Science Conference, 2000. 17th NRSC '2000. Seventeenth National

Conference_Location

Minufiya

Print_ISBN

977-5031-64-8

Type

conf

DOI

10.1109/NRSC.2000.838839

Filename

838839