Title :
Characteristics of shielded microstrip with finite conductivity and finite strip thickness
Author :
El-Hennawy, Adel E. ; El-Minyawi, Nagda M H ; Al-Saeed, Tarek A.
Author_Institution :
Fac. of Eng., Ain Shams Univ., Cairo, Egypt
Abstract :
An accurate full-wave mode matching approach is used to analyze the dispersion characteristics of shielded microstrip. In contrast to the usual perturbation method it includes metallic loss by a self-consistent description without skin effect approximation. The analysis holds for arbitrary high losses and also for metallization dimensions smaller than the skin depth. The metallic strip is considered to be of finite conductivity with finite metallization thickness. The substrate used is GaAs
Keywords :
dispersion (wave); electrical conductivity; inhomogeneous media; losses; metallisation; microstrip lines; mode matching; shielding; skin effect; waveguide theory; GaAs; III V semiconductor; MMIC; dispersion characteristics; finite conductivity; finite metallization thickness; finite strip thickness; full-wave mode matching; high losses; metallic loss; metallic strip; metallization dimensions; perturbation method; shielded microstrip characteristics; skin depth; substrate; Conductivity; Conductors; MMICs; Metallization; Microstrip; Perturbation methods; Region 1; Region 2; Skin; Strips;
Conference_Titel :
Radio Science Conference, 2000. 17th NRSC '2000. Seventeenth National
Conference_Location :
Minufiya
Print_ISBN :
977-5031-64-8
DOI :
10.1109/NRSC.2000.838839
