DocumentCode
1952291
Title
Low power and robust 8T/10T subthreshold SRAM cells
Author
Ebrahimi, Behzad ; Afzali-Kusha, Hassan ; Afzali-Kusha, Ali
Author_Institution
Nanoelectron. Center of Excellence, Univ. of Tehran, Tehran, Iran
fYear
2012
fDate
19-21 Sept. 2012
Firstpage
141
Lastpage
144
Abstract
In this paper, we propose a novel 8T subthreshold SRAM cell for improving the writing “0” characteristics of the conventional 8T cell. In addition, a new 10T subthreshold SRAM cell based on FinFET structures which has a lower standby power is suggested. The characteristics of the proposed and conventional 8T and 10T structures in 32 nm planar bulk and FinFET technologies are compared. The results show that the 10T structures have better write characteristics thanks to the differential write and consume less static power while the 8T structures have higher read currents. Also, they reveal that FinFET based structures show better read and write characteristics while consuming less static power with less variation in the presence of process variations.
Keywords
MOSFET; SRAM chips; low-power electronics; FinFET structures; FinFET technology; planar bulk; process variations; read characteristics; standby power; static power; subthreshold SRAM cells; write characteristics; Circuit stability; FinFETs; Logic gates; Random access memory; Stability analysis; Writing; 10T cell; 8T cell; FinFET; low power; process variations; stability; subthreshold SRAM;
fLanguage
English
Publisher
ieee
Conference_Titel
Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2012 International Conference on
Conference_Location
Seville
Print_ISBN
978-1-4673-0685-0
Type
conf
DOI
10.1109/SMACD.2012.6339437
Filename
6339437
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