• DocumentCode
    1952291
  • Title

    Low power and robust 8T/10T subthreshold SRAM cells

  • Author

    Ebrahimi, Behzad ; Afzali-Kusha, Hassan ; Afzali-Kusha, Ali

  • Author_Institution
    Nanoelectron. Center of Excellence, Univ. of Tehran, Tehran, Iran
  • fYear
    2012
  • fDate
    19-21 Sept. 2012
  • Firstpage
    141
  • Lastpage
    144
  • Abstract
    In this paper, we propose a novel 8T subthreshold SRAM cell for improving the writing “0” characteristics of the conventional 8T cell. In addition, a new 10T subthreshold SRAM cell based on FinFET structures which has a lower standby power is suggested. The characteristics of the proposed and conventional 8T and 10T structures in 32 nm planar bulk and FinFET technologies are compared. The results show that the 10T structures have better write characteristics thanks to the differential write and consume less static power while the 8T structures have higher read currents. Also, they reveal that FinFET based structures show better read and write characteristics while consuming less static power with less variation in the presence of process variations.
  • Keywords
    MOSFET; SRAM chips; low-power electronics; FinFET structures; FinFET technology; planar bulk; process variations; read characteristics; standby power; static power; subthreshold SRAM cells; write characteristics; Circuit stability; FinFETs; Logic gates; Random access memory; Stability analysis; Writing; 10T cell; 8T cell; FinFET; low power; process variations; stability; subthreshold SRAM;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2012 International Conference on
  • Conference_Location
    Seville
  • Print_ISBN
    978-1-4673-0685-0
  • Type

    conf

  • DOI
    10.1109/SMACD.2012.6339437
  • Filename
    6339437