DocumentCode :
1952361
Title :
Current density aware algorithm for net generation in analog high current application
Author :
Jonquères, J.M. ; Portal, J.M. ; Micolau, G. ; Ginez, O.
Author_Institution :
IM2NP, Aix-Marseille Univ., Marseille, France
fYear :
2012
fDate :
19-21 Sept. 2012
Firstpage :
153
Lastpage :
156
Abstract :
In deep submicron VLSI circuits, excessive current density in interconnects is a major concern for analog high current application. If current over maximum density is not effectively mitigated, this can lead to phenomena like electromigration, voltage drop and electrical overload. It is a hot topic of interest in modern circuits due to the decrease of metal track sizes while high currents are necessary in automotive or mobile applications. In this paper, an algorithm considering current constraints for net generation is presented. It determines all branch currents and proposes a routing for signal nets with current-dependent wire width. First, the phenomena of electromigration and voltage drop are introduced. The current constrained wire planning algorithm is presented and shows results improved on average by about 10% for area and almost 27% for CPU time compared with existing solution.
Keywords :
VLSI; current density; electromigration; integrated circuit interconnections; wires (electric); CPU time; analog high current application; automotive applications; branch currents; current constrained wire planning algorithm; current density aware algorithm; current-dependent wire width; deep submicron VLSI circuits; electrical overload; electromigration; mobile applications; net generation; signal net routing; voltage drop; Algorithm design and analysis; Clustering algorithms; Current density; Electromigration; Greedy algorithms; Routing; Wires; Wire planning; algorithm; current constraints; electromigration; routing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2012 International Conference on
Conference_Location :
Seville
Print_ISBN :
978-1-4673-0685-0
Type :
conf
DOI :
10.1109/SMACD.2012.6339440
Filename :
6339440
Link To Document :
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