Author_Institution :
Dept. of Mech. Eng., California Univ., Berkeley, CA, USA
Abstract :
This paper presents a set of thermo-mechanical process models for unit processes in inner and outer layer circuitization. By assessing the thermal, mechanical and chemical behavior of these processes, energy utilization and raw waste mass streams can be estimated from process and board design parameters. The processes modeled through this methodology include laminate core fabrication, resist coating, exposure, development, copper etch, resist strip, oxide treatment, lamination, drilling, desmear/copper plating and solder masking. For each process, key solid, liquid and vapor waste streams are predicted through mass balance and thermal and fluid losses determined, The raw mass outputs can be weighted through a multi-criteria health hazard assessment to determine comparisons for waste stream “quality” within the control volume of the facility. In this manner, hazard assessment for products or facilities can be evaluated from the unit process level. A case study of a six-layer PCB design for a computer workstation is presented to illustrate design trade-off analyses and integration of the process models within a computer-aided design environmen.,
Keywords :
coating techniques; electroplating; environmental factors; etching; health hazards; laminates; machining; photolithography; printed circuit design; printed circuit manufacture; protective coatings; surface treatment; Cu; PCB manufacturing; chemical behavior; copper etch; copper plating; development; drilling; energy utilization; environmental factors; exposure; laminate core fabrication; lamination; mechanical behavior; multi-criteria health hazard assessment; oxide treatment; printed circuit board design; process modelling; raw waste mass streams; resist coating; resist strip; solder masking; thermal behavior; thermo-mechanical process models; Chemical processes; Circuits; Copper; Environmental factors; Fabrication; Hazards; Laminates; Process design; Resists; Thermomechanical processes;
Conference_Titel :
Electronics and the Environment, 1997. ISEE-1997., Proceedings of the 1997 IEEE International Symposium on