Title :
Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)
Abstract :
The following topics were dealt with. DFM; design for reliability; electronic manufacturing; DSM modelling; EDA tools; low power test; IP blocks; and design quality
Keywords :
design for manufacture; electronic design automation; electronic equipment manufacture; industrial property; low-power electronics; quality control; reliability; DFM; DSM modelling; EDA tools; IP blocks; design for reliability; design quality; electronic manufacturing; low power test;
Conference_Titel :
Quality Electronic Design, 2000. ISQED 2000. Proceedings. IEEE 2000 First International Symposium on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7695-0525-2
DOI :
10.1109/ISQED.2000.838850
