Title :
Measuring design quality by measuring design complexity
Author_Institution :
Synopsys Inc., USA
Abstract :
Chips continue to get larger and more complex, and as they do, design quality continues to become more difficult and more important. Improving quality metrics is a key to addressing this problem, both for measuring quality and for predicting design quality early in the design cycle. This paper proposes a method of quantifying design complexity, enabling design teams to produce architectures and implementations that manage complexity, and hence quality, effectively
Keywords :
integrated circuit design; integrated circuit measurement; chip design; design complexity measurement; design quality measurement; Automatic testing; Chip scale packaging; Clocks; Computer bugs; Design methodology; Electronic design automation and methodology; Encapsulation; Hardware; Moore´s Law; Semiconductor device measurement;
Conference_Titel :
Quality Electronic Design, 2000. ISQED 2000. Proceedings. IEEE 2000 First International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-0525-2
DOI :
10.1109/ISQED.2000.838861