• DocumentCode
    1952821
  • Title

    Nanometer scale thin-film-edge emitter devices with high current density characteristics

  • Author

    Akinwande, A.I. ; Bauhahn, P.E. ; Gray, H.F. ; Ohnstein, T.R. ; Holmen, J.O.

  • Author_Institution
    Sensor & Syst. Dev. Center, Honeywell Inc., Bloomington, MN, USA
  • fYear
    1992
  • fDate
    13-16 Dec. 1992
  • Firstpage
    367
  • Lastpage
    370
  • Abstract
    We report the demonstration of thin-film-edge emitter devices with reproducible high current density characteristics. The demonstrated devices include both diodes and triodes with thin film emitters, anodes and control electrodes on the same wafer. Contrasted with the usual vertical FEA structures, this particular triode design invokes two dimensional vertical symmetry for the extraction electrodes using multi-layer thin-film deposition and patterning techniques. Emission currents as high as 400 mu A per edge have been demonstrated and current densities as high as 10 mu A/ mu m of edge width.<>
  • Keywords
    current density; diodes; electron field emission; nanotechnology; triodes; vacuum microelectronics; 400 muA; control electrodes; current densities; dimensional vertical symmetry; diodes; emission currents; extraction electrodes; multi-layer thin-film deposition; nanometer scale thin-film-edge emitter devices; patterning; reproducible high current density characteristics; thin-film-edge emitter; triodes; Current density; Diodes; Electron emission; Electron tubes; Nanotechnology; Vacuum microelectronics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1992. IEDM '92. Technical Digest., International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-0817-4
  • Type

    conf

  • DOI
    10.1109/IEDM.1992.307379
  • Filename
    307379