Title :
Noise safety design methodologies
Author :
Graziano, M. ; Delaurenti, M. ; Masera, G. ; Piccinini, G. ; Zamboni, M.
Author_Institution :
Dept. of Electron., Politecnico di Torino, Italy
Abstract :
The increasing densities in growing size circuits leads us to consider as an issue noise problems such as crosstalk, switching noise, electromigration and substrate injection. Noise safety must be a clear objective in design tools, whose development must then include circuit models for the analysis of noise phenomena. This paper points out a proposed methodology in the development of new models and related tools that focus on the noise immunity of circuit design
Keywords :
VLSI; circuit CAD; circuit optimisation; crosstalk; electromigration; integrated circuit design; integrated circuit modelling; integrated circuit noise; integrated circuit reliability; circuit models; crosstalk; deep submicron effects; design tools; electromigration; noise immunity; noise safety design methodologies; substrate injection; switching noise; Circuit noise; Circuit synthesis; Crosstalk; Design methodology; Electromigration; Integrated circuit noise; Noise generators; Safety; Very large scale integration; Working environment noise;
Conference_Titel :
Quality Electronic Design, 2000. ISQED 2000. Proceedings. IEEE 2000 First International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-0525-2
DOI :
10.1109/ISQED.2000.838869
