Noise safety design methodologies

Author

Graziano, M. ; Delaurenti, M. ; Masera, G. ; Piccinini, G. ; Zamboni, M.

Author_Institution

Dept. of Electron., Politecnico di Torino, Italy

fYear

2000

fDate

2000

Firstpage

157

Lastpage

164

Abstract

The increasing densities in growing size circuits leads us to consider as an issue noise problems such as crosstalk, switching noise, electromigration and substrate injection. Noise safety must be a clear objective in design tools, whose development must then include circuit models for the analysis of noise phenomena. This paper points out a proposed methodology in the development of new models and related tools that focus on the noise immunity of circuit design

Keywords

VLSI; circuit CAD; circuit optimisation; crosstalk; electromigration; integrated circuit design; integrated circuit modelling; integrated circuit noise; integrated circuit reliability; circuit models; crosstalk; deep submicron effects; design tools; electromigration; noise immunity; noise safety design methodologies; substrate injection; switching noise; Circuit noise; Circuit synthesis; Crosstalk; Design methodology; Electromigration; Integrated circuit noise; Noise generators; Safety; Very large scale integration; Working environment noise;

fLanguage

English

Publisher

ieee

Conference_Titel

Quality Electronic Design, 2000. ISQED 2000. Proceedings. IEEE 2000 First International Symposium on

Conference_Location

San Jose, CA

Print_ISBN

0-7695-0525-2

Type

conf

DOI

10.1109/ISQED.2000.838869

Filename

838869