DocumentCode
1952968
Title
The Impact of loading on the occurrence of high order modes in TEM waveguides
Author
Al-Hamid, Moawia ; Schulze, Steffen ; Garbe, Heyno ; Nitsch, Jürgen
Author_Institution
Magdeburg Univ., Magdeburg
fYear
2007
fDate
26-29 June 2007
Firstpage
145
Lastpage
148
Abstract
The present paper deals with two common test sites, namely the GTEM cell and the Crawford cell. It is shown, what are the fields inside an empty cell and how they change when the cell is loaded with an EUT.
Keywords
TEM cells; electromagnetic compatibility; waveguides; Crawford cell; GTEM cell; TEM waveguides; electromagnetic compatibility; Cutoff frequency; Electromagnetic compatibility; Electromagnetic waveguides; Load modeling; Numerical simulation; Reflection; Resonance; Stripline; TEM cells; Testing; TEM cell; higher order modes; loading; numerical field simulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility and Electromagnetic Ecology, 2007 7th International Symposium on
Conference_Location
Saint-Petersburg
Print_ISBN
978-1-4244-1269-3
Electronic_ISBN
978-1-4244-1270-9
Type
conf
DOI
10.1109/EMCECO.2007.4371671
Filename
4371671
Link To Document