DocumentCode :
1952968
Title :
The Impact of loading on the occurrence of high order modes in TEM waveguides
Author :
Al-Hamid, Moawia ; Schulze, Steffen ; Garbe, Heyno ; Nitsch, Jürgen
Author_Institution :
Magdeburg Univ., Magdeburg
fYear :
2007
fDate :
26-29 June 2007
Firstpage :
145
Lastpage :
148
Abstract :
The present paper deals with two common test sites, namely the GTEM cell and the Crawford cell. It is shown, what are the fields inside an empty cell and how they change when the cell is loaded with an EUT.
Keywords :
TEM cells; electromagnetic compatibility; waveguides; Crawford cell; GTEM cell; TEM waveguides; electromagnetic compatibility; Cutoff frequency; Electromagnetic compatibility; Electromagnetic waveguides; Load modeling; Numerical simulation; Reflection; Resonance; Stripline; TEM cells; Testing; TEM cell; higher order modes; loading; numerical field simulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility and Electromagnetic Ecology, 2007 7th International Symposium on
Conference_Location :
Saint-Petersburg
Print_ISBN :
978-1-4244-1269-3
Electronic_ISBN :
978-1-4244-1270-9
Type :
conf
DOI :
10.1109/EMCECO.2007.4371671
Filename :
4371671
Link To Document :
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