DocumentCode :
1953
Title :
External Capacitor-Less Low Drop-Out Regulator With 25 dB Superior Power Supply Rejection in the 0.4–4 MHz Range
Author :
Chang-Joon Park ; Onabajo, Marvin ; Silva-Martinez, Jose
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas A&M Univ., College Station, PA, USA
Volume :
49
Issue :
2
fYear :
2014
fDate :
Feb. 2014
Firstpage :
486
Lastpage :
501
Abstract :
This paper presents design techniques for a high power supply rejection (PSR) low drop-out (LDO) regulator. A bulky external capacitor is avoided to make the LDO suitable for system-on-chip (SoC) applications while maintaining the capability to reduce high-frequency supply noise. The paths of the power supply noise to the LDO output are analyzed, and a power supply noise cancellation circuit is developed. The PSR performance is improved by using a replica circuit that tracks the main supply noise under process-voltage-temperature variations and all operating conditions. The effectiveness of the PSR enhancement technique is experimentally verified with an LDO that was fabricated in a 0.18 μm CMOS technology with a power supply of 1.8 V. The active core chip area is 0.14 mm2, and the entire proposed LDO consumes 80 μA of quiescent current during operation mode and 55 μA of quiescent current in standby mode. It has a drop-out voltage of 200 mV when delivering 50 mA to the load. The measured PSR is better than -56 dB up to 4 MHz when delivering a current of 50 mA. Compared to a conventional uncompensated LDO, the proposed architecture presents a PSR improvement of 34 dB and 25 dB at 1 MHz and 4 MHz, respectively.
Keywords :
CMOS integrated circuits; controllers; integrated circuit design; integrated circuit noise; power supply circuits; system-on-chip; CMOS technology; PSR enhancement technique; active core chip; bulky external capacitor; current 50 mA; current 55 muA; current 80 muA; external capacitorless low drop out regulator; frequency 1 MHz; frequency 4 MHz; high frequency supply noise; operating conditions; power supply noise cancellation circuit; process voltage temperature variations; quiescent current; replica circuit; size 0.18 mum; superior power supply rejection; system on chip applications; voltage 1.8 V; voltage 200 mV; Capacitors; Impedance; Logic gates; Noise; Power supplies; Regulators; Transistors; External capacitor-less LDO; fast capacitor-less LDO; high PSR LDO; low drop-out (LDO) regulator; low-noise LDO; power management; power supply rejection (PSR);
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2013.2289897
Filename :
6675881
Link To Document :
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