DocumentCode :
1953016
Title :
Cost-effective approach in LDMOS with partial 0.35μm design into conventional 0.6μm process
Author :
Kubota, Toshiro ; Watanabe, Kiminori ; Karouji, Kumiko ; Ueno, Mitsuru ; Anai, Yasuko ; Kawaguchi, Yusuke ; Nakagawa, Akio
Author_Institution :
Syst. LSI Div., Toshiba Corp. Semicond. Co., Kitakyushu, Japan
fYear :
2003
fDate :
14-17 April 2003
Firstpage :
245
Lastpage :
248
Abstract :
We propose a practical solution, which can provide the same high performance LDMOS as that of the more advanced CMOS design rule with retaining still the low cost of the old technology. More specifically, we have introduced a limited number of 0.35μm equivalent mask alignment steps into 0.6μm based BCD processes. We have successfully developed 0.6μm design based 40V and 50V LDMOS, whose on-resistances are superior to those of 0.35μm based LDMOS. The on-resistance of the developed 40V and 50V LDMOS are 54.3 and 69.7 mΩ mm2, respectively. These values are superior to the reported values of the 0.35μm design LDMOS.
Keywords :
CMOS integrated circuits; electric resistance; integrated circuit design; integrated circuit economics; masks; power MOSFET; power integrated circuits; 0.35 micron; 0.6 micron; 40 V; 50 V; BCD process; cost-effective approach; high performance LDMOS; mask alignment step; CMOS logic circuits; CMOS process; CMOS technology; Costs; Laboratories; Large scale integration; Lithography; Logic design; Power dissipation; Process design;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and ICs, 2003. Proceedings. ISPSD '03. 2003 IEEE 15th International Symposium on
Print_ISBN :
0-7803-7876-8
Type :
conf
DOI :
10.1109/ISPSD.2003.1225274
Filename :
1225274
Link To Document :
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