Title :
The VME-based Do Muon Trigger Electronics
Author :
Fortner, Michael R.
Author_Institution :
Northern Illinois University
Keywords :
Backplanes; Detectors; Electronic equipment testing; Hardware; Iron; Latches; Mesons; Microprocessors; Physics; Toroidal magnetic fields;
Conference_Titel :
Nuclear Science Symposium, 1990. Conference record : Including Sessions on Nuclear Power Systems and Medical Imaging Conference, 1990 IEEE
Print_ISBN :
0-87942-683-7
DOI :
10.1109/NSSMIC.1990.693437
