Title :
Delay computation in switch-level models of non-treelike MOS circuits
Author :
Martin, D. ; Rumin, N.C.
Author_Institution :
Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada
Abstract :
Various algorithmic and heuristic techniques are proposed for dealing with the problem of computing delays in switch-level models of MOS transistor circuits which contain loops. The nonlinear dependence of the effective channel resistance on the capacitive load is dealt with by adjusting the resistance within the iterative process of computing delay, using the Lin and Mead algorithm. Heuristics are proposed for reducing the number of iterations by splitting the loops at high capacitance nodes and by basing the initial values of the split capacitances on the path conductances. It is demonstrated that the decomposition of the transistor groups into bicomponents is very effective for large groups. Combinations of these techniques have been tested on a large variety of circuits, a representative subset of which is presented.<>
Keywords :
MOS integrated circuits; capacitance; circuit analysis computing; delays; heuristic programming; integrated logic circuits; iterative methods; logic CAD; Lin and Mead algorithm; MOS transistor circuits; bicomponents; capacitive load; delay computation; effective channel resistance; heuristic techniques; high capacitance nodes; iterative process; loop splitting; nonlinear dependence; nontreelike MOS circuits; path conductances; split capacitances; switch-level models; transistor group decomposition; Capacitance; Circuit testing; Computational modeling; Delay; Equations; Iterative algorithms; Logic; MOSFETs; Switches; Switching circuits;
Conference_Titel :
Computer-Aided Design, 1988. ICCAD-88. Digest of Technical Papers., IEEE International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-0869-2
DOI :
10.1109/ICCAD.1988.122528