DocumentCode :
1953140
Title :
Contribution to thick film interdigital capacitor characterization
Author :
Pulec, Jiri ; Szendiuch, Ivan
Author_Institution :
Dept. of Microelectron., Brno Univ. of Technol., Brno, Czech Republic
fYear :
2011
fDate :
11-15 May 2011
Firstpage :
50
Lastpage :
52
Abstract :
This article deals with characterization of thick film interdigital capacitors, where attention is devoted to the influence of air gap width on capacitance. Air gap serves as dielectric and the scope of interest is dependence of the capacitance on air gap width. The set of interdigital capacitors was created with different air gap width. These capacitors were measured and result is evaluated in this article.
Keywords :
thick film capacitors; air gap width; dielectric; thick film interdigital capacitor characterization; Capacitance; Capacitance measurement; Capacitors; Electric fields; Insulation; Seminars; Thick films;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Technology (ISSE), 2011 34th International Spring Seminar on
Conference_Location :
Tratanska Lomnica
ISSN :
2161-2528
Print_ISBN :
978-1-4577-2111-3
Type :
conf
DOI :
10.1109/ISSE.2011.6053548
Filename :
6053548
Link To Document :
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