Title :
The Low-Frequency Noise Behavior of Gate-All-Around Soi Transistors
Author :
Simoen, E. ; Magnusson, U. ; Claeys, Cor ; Colinge, J.P.
Author_Institution :
IMEC, Leuven, Belgium
Keywords :
Electrons; Fabrication; Low-frequency noise; Noise level; Noise measurement; Noise reduction; Springs; Substrates; Temperature; Transconductance;
Conference_Titel :
SOI Conference, 1992. IEEE International
Conference_Location :
Ponte Vedra Beach, FL
Print_ISBN :
0-7803-7439-8
DOI :
10.1109/SOI.1992.664821
