DocumentCode

1953166

Title

The Low-Frequency Noise Behavior of Gate-All-Around Soi Transistors

Author

Simoen, E. ; Magnusson, U. ; Claeys, Cor ; Colinge, J.P.

Author_Institution

IMEC, Leuven, Belgium

fYear

1992

fDate

6-8 Oct. 1992

Firstpage

116

Lastpage

117

Keywords

Electrons; Fabrication; Low-frequency noise; Noise level; Noise measurement; Noise reduction; Springs; Substrates; Temperature; Transconductance;

fLanguage

English

Publisher

ieee

Conference_Titel

SOI Conference, 1992. IEEE International

Conference_Location

Ponte Vedra Beach, FL

ISSN

1078-621X

Print_ISBN

0-7803-7439-8

Type

conf

DOI

10.1109/SOI.1992.664821

Filename

664821