DocumentCode :
1953226
Title :
Method for in-situ thermal load testing of high-brightness LED arrays
Author :
Mashkov, Petko ; Gyoch, Berkant ; Penchev, Stanislav ; Beloev, Hristo ; Nicolics, J.
Author_Institution :
Univ. of Ruse, Ruse, Bulgaria
fYear :
2013
fDate :
8-12 May 2013
Firstpage :
41
Lastpage :
46
Abstract :
Frequently the direct assessment of the LEDs´ junction temperature as one of the main parameters to evaluate the extent of the thermal load is possible only under laboratory conditions. In this paper we present the development of a cheap and reliable experimental method to establish the junction temperature of high-brightness LED arrays under operating conditions. It is based on the in-situ determination of the temperature dependence of the LEDs´ forward voltage drop. Three different types of high-flux LED arrays are investigated (nominal forward voltage between 18 and 45 V) at various ambient conditions (air temperatures from 20°C to 45°C) and values of forward current ranging from 270 mA to 720 mA. Recommendations on calibration, calculation and junctions´ temperatures evaluation are presented. The developed method also allows to achieve reliable results of the in situ thermal performance of the entire lamps consisting of high-flux LED arrays mounted on a cooler.
Keywords :
LED lamps; electric potential; temperature measurement; current 270 mA to 720 mA; forward voltage drop; high-brightness LED arrays; high-flux LED arrays; in situ thermal performance; junction temperature; temperature 20 C to 45 C; temperature dependence; thermal load; voltage 18 V to 45 V; Heat sinks; Heating; Junctions; Light emitting diodes; Temperature; Temperature measurement; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Technology (ISSE), 2013 36th International Spring Seminar on
Conference_Location :
Alba Iulia
ISSN :
2161-2528
Type :
conf
DOI :
10.1109/ISSE.2013.6648212
Filename :
6648212
Link To Document :
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