Title :
Implement TPS with ATML and NI TestStand
Author :
Shuyi, Fan ; Chen, Meng ; Huixia, Jiang
Author_Institution :
Ordnance Eng. Coll., Shijiazhuang, China
Abstract :
The Automatic Test Markup Language (ATML) is a documentation standard for automatic test information. ATML was born out of the thought that it is “the information” and a way to “communicate that information” may be the way to improve upon the inefficiencies of testing in both time and budget. ATML defines a collection of IEEE Standards and XML schema that represent automatic test related information (such as test description, test results, UUT description and instrument description) which will provide increased ATE system compatibility and Test Program Set (TPS) transportability. The two most adopted XML schemas in the ATML standard are Test Description (TD) and Test Results. Many organizations are expecting the adoption of ATML TD standards to reduce the development and maintenance costs of TPS and expecting the adoption of Test Results to facilitate sharing the test outcomes up and down the maintenance chain of product. This paper discusses how to translate ATML TD to National Instruments (NI) TestStand TPS with ATML TD TestStand translator. Finally, a test report which conformance to ATML standards is generated.
Keywords :
XML; NI teststand; automatic test markup language; national instruments; test program set; Instruments; Three dimensional displays; Variable speed drives; XML; ATML; ATS; NI TestStand; Test Description;
Conference_Titel :
Computer Science and Information Technology (ICCSIT), 2010 3rd IEEE International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-5537-9
DOI :
10.1109/ICCSIT.2010.5564805