• DocumentCode
    1953378
  • Title

    Mechanical problems of novel back contact solar modules

  • Author

    Wiese, S. ; Kraemer, F. ; Peter, E. ; Seib, J.

  • Author_Institution
    Dept. of Microintegration & Reliability, Saarland Univ., Saarbrucken, Germany
  • fYear
    2012
  • fDate
    16-18 April 2012
  • Firstpage
    42375
  • Lastpage
    42527
  • Abstract
    In this paper, the mechanical integrity of interconnect structures of different types of photovoltaic modules is analyzed by FEM-simulations. The goal is to develop a theoretical framework for the systematic understanding of mechanical behavior of photovoltaic modules. The results of this investigation figure out, where are critical locations in the photovoltaic module assembly that limit the module lifetime. Another goal is to show, how changes in the assembly technology (e.g. geometries, processes, materials) will have an effect on the overall reliability of the photovoltaic module. FEM-Simulations were carried out, in order to analyze the mechanical stresses, which were built up during the operation of the photovoltaic modules. Thermo cycling test between -40°C and +80°C were simulated. These tests are used in the qualification procedure for photovoltaic modules according to TEC/EN 61215. The results of the study show that stresses during the assembly and the operation occur in different locations in dependence of the assembly design. Tn the traditional modules the silicon underneath the busbar and the copper ribbon crimp between two adjunct cells are the locations where most of the damage is likely to accumulate. In contrast to this the solder joints in the outermost row of the back contact cells are the critical locations in the novel back contact design. The paper will explain the differences of thermo-mechanical behavior between the designs.
  • Keywords
    busbars; electrical contacts; finite element analysis; power system reliability; solar cells; solders; FEM-simulations; TEC/EN 61215; back contact solar modules; busbar; copper ribbon crimp; interconnect structures; mechanical integrity; mechanical stresses; photovoltaic module reliability; photovoltaic modules; solder joints; temperature -40 C to 80 C; thermo cycling test; Aluminum; Copper; Creep; Plastics; Reliability; Solar power generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2012 13th International Conference on
  • Conference_Location
    Cascais
  • Print_ISBN
    978-1-4673-1512-8
  • Type

    conf

  • DOI
    10.1109/ESimE.2012.6191770
  • Filename
    6191770