DocumentCode

1953412

Title

A New Method for Characterizing Dynamic Self-Heating in Soi Mosfets

Author

Caviglia, Anthony ; Iliadis, Agis A.

Author_Institution

University of Maryland, EE Department, MD

fYear

1992

fDate

6-8 Oct. 1992

Firstpage

118

Lastpage

119

Keywords

Equivalent circuits; Frequency measurement; Heating; MOSFETs; Microwave FETs; Scattering parameters; Temperature; Thermal resistance; Time measurement; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

SOI Conference, 1992. IEEE International

Conference_Location

Ponte Vedra Beach, FL

ISSN

1078-621X

Print_ISBN

0-7803-7439-8

Type

conf

DOI

10.1109/SOI.1992.664822

Filename

664822