Title :
A New Method for Characterizing Dynamic Self-Heating in Soi Mosfets
Author :
Caviglia, Anthony ; Iliadis, Agis A.
Author_Institution :
University of Maryland, EE Department, MD
Keywords :
Equivalent circuits; Frequency measurement; Heating; MOSFETs; Microwave FETs; Scattering parameters; Temperature; Thermal resistance; Time measurement; Voltage;
Conference_Titel :
SOI Conference, 1992. IEEE International
Conference_Location :
Ponte Vedra Beach, FL
Print_ISBN :
0-7803-7439-8
DOI :
10.1109/SOI.1992.664822
