Title :
Design quality and design efficiency; definitions, metrics and relevant design experiences
Author_Institution :
Dept. of Phys. Electron., Norwegian Univ. of Sci. & Technol., Norway
Abstract :
Design quality metrics will be defined in terms of the probability that a completed design satisfies its specifications The definition rests on the concept of atomic design operations, and is by nature canonical. It is shown that this definition is truly analogous to test quality, leading to a unified model of test and design quality. Another important aspect of the design is its efficiency, related to design parameters. The metrics of design efficiency may be expressed as a cost function, and different design proposals may be evaluated against estimated design efficiency. Examples from several years of graduate level student design experiments will be given in order to demonstrate the usefulness of these metrics
Keywords :
design engineering; probability; quality control; atomic design operations; cost function; design efficiency; design experiences; design parameters; design quality; probability; test quality; Costs; Data mining; Design optimization; Digital circuits; Electrical capacitance tomography; Error correction; Manufacturing processes; Process design; Semiconductor device measurement; Testing;
Conference_Titel :
Quality Electronic Design, 2000. ISQED 2000. Proceedings. IEEE 2000 First International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-0525-2
DOI :
10.1109/ISQED.2000.838902