DocumentCode :
1953561
Title :
Design quality and design efficiency; definitions, metrics and relevant design experiences
Author :
Aas, Einar J.
Author_Institution :
Dept. of Phys. Electron., Norwegian Univ. of Sci. & Technol., Norway
fYear :
2000
fDate :
2000
Firstpage :
389
Lastpage :
394
Abstract :
Design quality metrics will be defined in terms of the probability that a completed design satisfies its specifications The definition rests on the concept of atomic design operations, and is by nature canonical. It is shown that this definition is truly analogous to test quality, leading to a unified model of test and design quality. Another important aspect of the design is its efficiency, related to design parameters. The metrics of design efficiency may be expressed as a cost function, and different design proposals may be evaluated against estimated design efficiency. Examples from several years of graduate level student design experiments will be given in order to demonstrate the usefulness of these metrics
Keywords :
design engineering; probability; quality control; atomic design operations; cost function; design efficiency; design experiences; design parameters; design quality; probability; test quality; Costs; Data mining; Design optimization; Digital circuits; Electrical capacitance tomography; Error correction; Manufacturing processes; Process design; Semiconductor device measurement; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design, 2000. ISQED 2000. Proceedings. IEEE 2000 First International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-0525-2
Type :
conf
DOI :
10.1109/ISQED.2000.838902
Filename :
838902
Link To Document :
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