DocumentCode :
1953568
Title :
Evaluation of the fracture behaviour of surface mounted technology components by electrical measurements
Author :
Kyrychenko, Mykhailo ; Wohlrabe, Heinz ; Meyer, Steffen ; Reuter, Hartmut ; Keil, Manfred
Author_Institution :
Electron. Packaging Lab., Tech. Univ. Dresden, Dresden, Germany
fYear :
2013
fDate :
8-12 May 2013
Firstpage :
115
Lastpage :
120
Abstract :
SMT (surface mounted technology) components are exposed to mechanical stress during the assembly process of the modules. During an optical or/and electrical inspection these pre-damages may be not detected. But later this stress can cause permanent damage of the component. It is supposed that due to bending of damaged SMT components their electrical parameters will change. Damage will be inflicted by a newly developed tool called “drop tester”. In this article a new method of the pre-damage creation for SMT components and a new idea of the method for the damages research are presented. The results of the drop test of resistors before the soldering process are shown. And the results of the resistances´ and capacities´ changing during the bending process are introduced.
Keywords :
bending; electric variables measurement; fracture; stress effects; surface mount technology; assembly process; bending; drop tester; electrical inspection; electrical measurements; fracture behaviour; mechanical stress; optical inspection; pre-damage creation; resistors; soldering process; surface mounted technology components; Capacitance; Capacitors; Electrical resistance measurement; Resistors; Seminars; Springs; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Technology (ISSE), 2013 36th International Spring Seminar on
Conference_Location :
Alba Iulia
ISSN :
2161-2528
Type :
conf
DOI :
10.1109/ISSE.2013.6648226
Filename :
6648226
Link To Document :
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