• DocumentCode
    1953568
  • Title

    Evaluation of the fracture behaviour of surface mounted technology components by electrical measurements

  • Author

    Kyrychenko, Mykhailo ; Wohlrabe, Heinz ; Meyer, Steffen ; Reuter, Hartmut ; Keil, Manfred

  • Author_Institution
    Electron. Packaging Lab., Tech. Univ. Dresden, Dresden, Germany
  • fYear
    2013
  • fDate
    8-12 May 2013
  • Firstpage
    115
  • Lastpage
    120
  • Abstract
    SMT (surface mounted technology) components are exposed to mechanical stress during the assembly process of the modules. During an optical or/and electrical inspection these pre-damages may be not detected. But later this stress can cause permanent damage of the component. It is supposed that due to bending of damaged SMT components their electrical parameters will change. Damage will be inflicted by a newly developed tool called “drop tester”. In this article a new method of the pre-damage creation for SMT components and a new idea of the method for the damages research are presented. The results of the drop test of resistors before the soldering process are shown. And the results of the resistances´ and capacities´ changing during the bending process are introduced.
  • Keywords
    bending; electric variables measurement; fracture; stress effects; surface mount technology; assembly process; bending; drop tester; electrical inspection; electrical measurements; fracture behaviour; mechanical stress; optical inspection; pre-damage creation; resistors; soldering process; surface mounted technology components; Capacitance; Capacitors; Electrical resistance measurement; Resistors; Seminars; Springs; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology (ISSE), 2013 36th International Spring Seminar on
  • Conference_Location
    Alba Iulia
  • ISSN
    2161-2528
  • Type

    conf

  • DOI
    10.1109/ISSE.2013.6648226
  • Filename
    6648226