DocumentCode :
1953632
Title :
A Linear Sweep Technique for Determining Generation Lifetimes in Soi Mosfets
Author :
Venkatesan, S. ; Pierret, R.F. ; Neudeck, G.W.
Author_Institution :
School of Electrical Engineering, Purdue University, IN
fYear :
1992
fDate :
6-8 Oct. 1992
Firstpage :
120
Lastpage :
121
Keywords :
Charge-coupled image sensors; Leakage current; MOSFETs; P-n junctions; Pulse measurements; Semiconductor diodes; Semiconductor films; Semiconductor materials; Steady-state; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOI Conference, 1992. IEEE International
Conference_Location :
Ponte Vedra Beach, FL
ISSN :
1078-621X
Print_ISBN :
0-7803-7439-8
Type :
conf
DOI :
10.1109/SOI.1992.664823
Filename :
664823
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1953632
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