DocumentCode :
1953638
Title :
Tool interoperability is key to improved design quality
Author :
Goldman, Richard ; Bartleson, Karen
Author_Institution :
Synopsys Inc., USA
fYear :
2000
fDate :
2000
Firstpage :
407
Lastpage :
410
Abstract :
Deep submicron processes are driving silicon complexity, time-to-market windows continue to shrink and experienced design engineers are at a premium. The system-on-a-chip era is approaching and pushing technology at every turn. As a result, companies are looking for ways to get the most out of their design resources. High quality design systems, developed from powerful EDA tools and interface software, ensure more efficient use of resources and ultimately, high quality designs. Unfortunately, many engineers are spending time wrestling new tools into their design systems instead of designing or verifying their designs. The need for EDA tool interoperability has never been greater. Fortunately, some progressive EDA companies are spearheading efforts to improve tool interoperability. This paper will explore the benefits of tool interoperability and define several ways that it can be achieved
Keywords :
VLSI; application specific integrated circuits; circuit CAD; integrated circuit design; quality control; software tools; EDA tools; deep submicron processes; design quality; design resources; interface software; silicon complexity; system-on-a-chip era; time-to-market windows; tool interoperability; Convergence; Design engineering; Electronic design automation and methodology; Isolation technology; Power engineering and energy; Silicon; Software quality; Software tools; System-on-a-chip; Time to market;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design, 2000. ISQED 2000. Proceedings. IEEE 2000 First International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-0525-2
Type :
conf
DOI :
10.1109/ISQED.2000.838906
Filename :
838906
Link To Document :
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