• DocumentCode
    1953674
  • Title

    Long-term behavior of IMCs in lead-free solder joints

  • Author

    Novak, Tomas ; Hujer, Tomas ; Steiner, Frantisek

  • Author_Institution
    Dept. of Technol. & Meas., Univ. of West bohemia in Pilsen, Pilsen, Czech Republic
  • fYear
    2011
  • fDate
    11-15 May 2011
  • Firstpage
    176
  • Lastpage
    181
  • Abstract
    This article deals with the creation and growth of intermetallic compounds (IMCs) in solder joints. The test specimens of copper substrate were made for this experiment. The soldered joints were created on the test specimens by hand soldering process at the temperature of 250°C. Four lead-free solder alloys and one tin-lead solder alloy were chosen for research of IMCs. The test specimens were divided into several groups. These groups differ in two parameters. The first parameter is soldering process, concretely soldering time. Half of the specimens were soldered for a period of 10 seconds and the second half of specimens were soldered for a period of 60 seconds. The second parameter is a thermal stress. The test specimens were exposed to elevated aging for research of long-term behavior of IMCs in solder joint. The specimens were thermal stressed in hot air oven at the temperature of 150°C for a periods of 4, 8, 12, 16 and 20 weeks. The results of analysis of IMCs in solder joints using confocal and metallographic microscopes are presented in this article.
  • Keywords
    ageing; alloys; lead; lead alloys; materials testing; solders; thermal stresses; tin alloys; Cu; IMC; Pb; Sn-Pb; confocal microscopes; hand soldering; hot air oven; intermetallic compounds long-term behavior; lead-free solder joints; metallographic microscopes; soldering process; temperature 150 C; temperature 250 C; thermal stress; time 10 s; time 12 week; time 16 week; time 20 week; time 4 week; time 60 s; time 8 week; Aging; Copper; Lead; Soldering; Substrates; Thickness measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology (ISSE), 2011 34th International Spring Seminar on
  • Conference_Location
    Tratanska Lomnica
  • ISSN
    2161-2528
  • Print_ISBN
    978-1-4577-2111-3
  • Type

    conf

  • DOI
    10.1109/ISSE.2011.6053573
  • Filename
    6053573