Title :
Some Metrics for Accessing Quality of Product Line Architecture
Author :
Zhang, Tao ; Deng, Lei ; Wu, Jian ; Zhou, Qiaoming ; Ma, Chunyan
Author_Institution :
Sch. of Software & Microelectron., Northwestern Polytech. Univ., Xian
Abstract :
Product line architecture is the most important core asset of software product line. vADL, a product line architecture description languages, can be used for specifying product line architecture, and also provide enough information for measuring quality of product line architecture. In this paper, some new metrics are provided to assess similarity, variability, reusability, and complexity of product line architecture. The main feature of our approach is to assess the quality of product line architecture by analyzing its formal vADL specification, and therefore the process of metric computation can be automated completely.
Keywords :
formal specification; software architecture; software metrics; software quality; formal vADL specification; product line architecture description languages; product line architecture specification; quality accessment; software metrics; software product line; Architecture description languages; Computer architecture; Computer science; Connectors; Microelectronics; Programmable logic arrays; Software engineering; Software measurement; Software metrics; Software quality; architecture description language; product line architecture; software metrics; variability;
Conference_Titel :
Computer Science and Software Engineering, 2008 International Conference on
Conference_Location :
Wuhan, Hubei
Print_ISBN :
978-0-7695-3336-0
DOI :
10.1109/CSSE.2008.500