Title :
Design of totally self-checking checkers for Bose-Lin, Bose and Blaum codes
Author_Institution :
Dept. of Electr. Eng., Princeton Univ., NJ, USA
Abstract :
Some efficient systematic codes have recently been developed for detecting t unidirectional errors (Bose-Lin code) and burst unidirectional errors (Bose, Blaum codes). Since unidirectional errors are the most common errors in VLSI circuits, such codes should find widespread use. Totally self-checking (TSC) checker designs have been found for the three codes mentioned above. The designs are easily testable, economical, and have a modular structure. The design for the Bose-Lin code requires at most only 8r-4 codeword tests, where r is the number of checkbits. The number of codeword tests for the TSC checkers for the Bose code and the Blaum code is at most 8r +4 and 2´+8r, respectively
Keywords :
VLSI; error detection codes; fault tolerant computing; Blaum codes; Bose code; Bose-Lin code; VLSI circuits; burst unidirectional errors; codeword tests; modular structure; systematic codes; totally self-checking checkers; unidirectional errors; Circuit faults; Circuit testing; Decoding; Electrical fault detection; Encoding; Fault detection; Monitoring; Protection; Semiconductor memory; Very large scale integration;
Conference_Titel :
Circuits and Systems, 1989., Proceedings of the 32nd Midwest Symposium on
Conference_Location :
Champaign, IL
DOI :
10.1109/MWSCAS.1989.101788