DocumentCode :
1953860
Title :
Electrical and Thermal Feedback Effects on the Small-Signal Drain Characteristics of Partially-Depleted Soi Mosfets
Author :
Redman-White, W. ; Uren, M.J. ; Bunyan, R.J.T. ; Howes, R. ; Lee, M. ; Alderman, J.
Author_Institution :
Dept of Electronics and Computer Science, Southampton University, UK
fYear :
1992
fDate :
6-8 Oct. 1992
Firstpage :
122
Lastpage :
123
Keywords :
Capacitance; Diodes; Electrical resistance measurement; Feedback; Frequency dependence; Frequency measurement; Immune system; MOSFETs; Poles and zeros; Thermal conductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOI Conference, 1992. IEEE International
Conference_Location :
Ponte Vedra Beach, FL
ISSN :
1078-621X
Print_ISBN :
0-7803-7439-8
Type :
conf
DOI :
10.1109/SOI.1992.664824
Filename :
664824
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1953860
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