• DocumentCode
    1953982
  • Title

    Antifuse structure comparison for field programmable gate arrays

  • Author

    Chiang, S. ; Forouhi, R. ; Chen, W. ; Hawley, F. ; McCollum, D. ; Hamdy, E. ; Hu, C.

  • Author_Institution
    Actel Corp., Sunnyvale, CA, USA
  • fYear
    1992
  • fDate
    13-16 Dec. 1992
  • Firstpage
    611
  • Lastpage
    614
  • Abstract
    Antifuse structure as a programming element has become increasingly popular in field programmable gate array devices. In this paper we discuss the characteristics of various antifuse structures. Tradeoffs between performance and reliability are also discussed.<>
  • Keywords
    circuit reliability; electric breakdown of solids; electric fuses; leakage currents; logic arrays; stability; FPGA; antifuse structures; field programmable gate arrays; programming element; reliability; Circuit reliability; Electric breakdown; Fuses; Leakage currents; Logic arrays; Stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1992. IEDM '92. Technical Digest., International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-0817-4
  • Type

    conf

  • DOI
    10.1109/IEDM.1992.307435
  • Filename
    307435
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1953982