Title :
Antifuse structure comparison for field programmable gate arrays
Author :
Chiang, S. ; Forouhi, R. ; Chen, W. ; Hawley, F. ; McCollum, D. ; Hamdy, E. ; Hu, C.
Author_Institution :
Actel Corp., Sunnyvale, CA, USA
Abstract :
Antifuse structure as a programming element has become increasingly popular in field programmable gate array devices. In this paper we discuss the characteristics of various antifuse structures. Tradeoffs between performance and reliability are also discussed.<>
Keywords :
circuit reliability; electric breakdown of solids; electric fuses; leakage currents; logic arrays; stability; FPGA; antifuse structures; field programmable gate arrays; programming element; reliability; Circuit reliability; Electric breakdown; Fuses; Leakage currents; Logic arrays; Stability;
Conference_Titel :
Electron Devices Meeting, 1992. IEDM '92. Technical Digest., International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-0817-4
DOI :
10.1109/IEDM.1992.307435
