• DocumentCode
    1954122
  • Title

    A fault-tolerant scheme that copes with intermittent and transient faults in sequential circuits

  • Author

    Roberts, Morien W.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Clarkson Univ., Potsdam, NY, USA
  • fYear
    1989
  • fDate
    14-16 Aug 1989
  • Firstpage
    36
  • Abstract
    The vulnerability of fault-tolerant schemes, such as TMR (triple modular redundancy), to nonpermanent faults, such as intermittent and transient faults, is discussed. A methodology that can be used to design circuits so that they can better tolerate such faults is described. The problem of nonpermanent faults producing semipermanent faults in sequential circuits is addressed
  • Keywords
    fault tolerant computing; logic design; sequential circuits; fault-tolerant scheme; intermittent faults; logic design; nonpermanent faults; semipermanent faults; sequential circuits; transient faults; triple modular redundancy; Circuit faults; Circuit testing; Delay; Electromagnetic transients; Fault tolerance; Hardware; Nuclear magnetic resonance; Redundancy; Sequential circuits; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1989., Proceedings of the 32nd Midwest Symposium on
  • Conference_Location
    Champaign, IL
  • Type

    conf

  • DOI
    10.1109/MWSCAS.1989.101789
  • Filename
    101789
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1954122