RoHS-conform thick-film resistors on LTCC- and alumina substrates

Author

Hrovat, Marko ; Belavic, Darko ; Makarovic, Kostja

Author_Institution

Jozef Stefan Inst., Ljubljana, Slovenia

fYear

2013

fDate

8-12 May 2013

Firstpage

290

Lastpage

294

Abstract

Commercial lead-free thick-film resistors Du Pont CF-041, Ferro FX-87-B and Heraeus R-2141 with nominal sheet resistivities 10 kohm/sq. were printed and fired on alumina and LTCC substrates. The conductive phase - RuO₂ - in resistors was determined by X-ray powder diffraction analysis (XRD). Electrical characteristics, i.e., sheet resistivities, noise and gauge factors were measured. The microstructures and chemical composition of fired resistors were investigated by SEM and EDS.

Keywords

RoHS compliance; X-ray chemical analysis; X-ray diffraction; ceramic packaging; crystal microstructure; ruthenium compounds; scanning electron microscopy; thick film resistors; Al₂O₃; Du Pont CF-041; EDS; Ferro FX-87-B; Heraeus R-2141; LTCC-substrates; RoHS-conform thick-film resistors; RuO₂; SEM; X-ray powder diffraction analysis; XRD; alumina substrates; chemical composition; commercial lead-free thick-film resistors; conductive phase; electrical characteristics; fired resistors; microstructures; nominal sheet resistivity; Conductivity; Glass; Lead; Noise; Resistors; Substrates; Thick films;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics Technology (ISSE), 2013 36th International Spring Seminar on

Conference_Location

Alba Iulia

ISSN

2161-2528

Type

conf

DOI

10.1109/ISSE.2013.6648259

Filename

6648259