Title :
Activation of Nbti Degradation in Soi Pmos by Self-Heating
Author :
Bunyan, R.J.T. ; Uren, M.J. ; Alderman, J.C. ; Eccleston, W.
Author_Institution :
Dept. of Elec. Eng. and Electronics, University of Liverpool, UK
Keywords :
Charge measurement; Current measurement; Degradation; Density measurement; Energy measurement; MOS devices; Niobium compounds; Temperature distribution; Titanium compounds; Voltage;
Conference_Titel :
SOI Conference, 1992. IEEE International
Conference_Location :
Ponte Vedra Beach, FL
Print_ISBN :
0-7803-7439-8
DOI :
10.1109/SOI.1992.664827
