Title :
Noise generation by spoke feedback and sideband excitation in CFA´s
Author_Institution :
Sci. Applications Int. Corp., McLean, VA, USA
Abstract :
The recirculation of the spoke remnants in reentrant crossed-field devices and the destabilization of parasitic frequencies are examined independently, as two of the dominant sources of tube noise. In both cases the main build-up in the fluctuation level occurs near the input, within a distance related to the rise time for a new spoke/recycling time of the reentering spoke remnants. Therefore noise levels decrease with decreasing magnetic field and increase with decreasing input signal.<>
Keywords :
electron device noise; feedback; microwave amplifiers; microwave tubes; stability; destabilization; fluctuation level; magnetic field; noise generation; parasitic frequencies; reentering spoke remnants; sideband excitation; spoke feedback; tube noise; Feedback; Microwave amplifiers; Microwave tubes; Stability;
Conference_Titel :
Electron Devices Meeting, 1992. IEDM '92. Technical Digest., International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-0817-4
DOI :
10.1109/IEDM.1992.307467
