Title :
Measurement of end-hat effects in a crossed-field amplifier
Author :
Browning, J. ; Chung Chan ; Ye, J. ; MacGregor, R. ; Ruden, T.E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
Abstract :
A linear format, low frequency (150 MHz), low power (10 to 100 W), crossed-field amplifier is operated with variable bias, electrostatic confining electrodes (end-hats). The end-hat bias is found to cause electron transport only in the vicinity of the end-hats. End-hat current measurements indicate a substantial part of the electron beam current (40%) can be collected when the end-hats are biased more positive than the floating potential. The observed change in gain versus end-hat bias can be accounted for by the lost beam current. Device gain versus sole bias measurements have been compared with numerical simulations and give general agreement.<>
Keywords :
electrodes; electron tubes; microwave tubes; radiofrequency amplifiers; 10 to 100 W; 150 MHz; VHF; crossed-field amplifier; current measurements; electron beam current; electrostatic confining electrodes; end-hat effects; linear format; low power; variable bias; Electrodes; Electron tubes; Microwave tubes;
Conference_Titel :
Electron Devices Meeting, 1992. IEDM '92. Technical Digest., International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-0817-4
DOI :
10.1109/IEDM.1992.307468