• DocumentCode
    1954656
  • Title

    Considering the Dependency of Fault Detection and Correction in Software Reliability Modeling

  • Author

    Shu, Yanjun ; Wu, Zhibo ; Liu, Hongwei ; Yang, Xiaozong

  • Author_Institution
    Sch. of Comput. Sci. & Technol., Harbin Inst. of Technol., Harbin
  • Volume
    2
  • fYear
    2008
  • fDate
    12-14 Dec. 2008
  • Firstpage
    672
  • Lastpage
    675
  • Abstract
    Most existing software reliability growth models (SRGMs) focused on the fault detection process, while the fault correction process was ignored by assuming that the detected faults can be removed immediately and perfectly. However, these assumptions are not realistic. The fault correction process is a critical part in software testing. In this paper, we studied the dependency of the fault detection and correction processes in view of the number of faults. The ratio of corrected fault number to detected fault number is used to describe the dependency of the two processes, which appears S-shaped. Therefore, we adopt the logistical function to represent the ratio function. Based on this function, both fault correction and detection processes are modeled. The proposed models are evaluated by a data set of software testing. The experimental results show that the new models fit the data set of fault detection and correction processes very well.
  • Keywords
    program testing; software reliability; fault correction process; fault detection dependency; fault detection process; logistical function; ratio function; software reliability growth models; software reliability modeling; software testing; Computer science; Delay effects; Fault detection; Parameter estimation; Personnel; Predictive models; Software engineering; Software reliability; Software systems; Software testing; fault correction process; fault detection process; software reliability growth models; testing process;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science and Software Engineering, 2008 International Conference on
  • Conference_Location
    Wuhan, Hubei
  • Print_ISBN
    978-0-7695-3336-0
  • Type

    conf

  • DOI
    10.1109/CSSE.2008.1325
  • Filename
    4722140