• DocumentCode
    1954852
  • Title

    Performance Limitations of Deep-Submicron Fully Depleted Soi Mosfet´s

  • Author

    Fossum, J.G. ; Krishnan, S. ; Yeh, P.C.

  • Author_Institution
    VLSI TCAD Group, University of Florida, Gainesville, FL
  • fYear
    1992
  • fDate
    6-8 Oct. 1992
  • Firstpage
    132
  • Lastpage
    133
  • Keywords
    Degradation; Electron devices; Loss measurement; MOSFET circuits; Nonuniform electric fields; Performance analysis; Temperature control; Ultra large scale integration; Velocity measurement; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOI Conference, 1992. IEEE International
  • Conference_Location
    Ponte Vedra Beach, FL
  • ISSN
    1078-621X
  • Print_ISBN
    0-7803-7439-8
  • Type

    conf

  • DOI
    10.1109/SOI.1992.664828
  • Filename
    664828
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1954852