DocumentCode

1955107

Title

Analysis of Snapback in Soi nMosfets and its Use for an Soi Esd Protection Circuit

Author

Verhaege, K. ; Groeseneken, G. ; Colinge, J.P. ; Maes, H.E.

Author_Institution

IMEC, Leuven, Belgium

fYear

1992

fDate

6-8 Oct. 1992

Firstpage

140

Lastpage

141

Keywords

Circuits; Electric breakdown; Electrostatic discharge; MOSFETs; Optical films; Optical microscopy; Optical pulses; Protection; Stress; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

SOI Conference, 1992. IEEE International

Conference_Location

Ponte Vedra Beach, FL

ISSN

1078-621X

Print_ISBN

0-7803-7439-8

Type

conf

DOI

10.1109/SOI.1992.664831

Filename

664831