Title :
Analysis of Snapback in Soi nMosfets and its Use for an Soi Esd Protection Circuit
Author :
Verhaege, K. ; Groeseneken, G. ; Colinge, J.P. ; Maes, H.E.
Author_Institution :
IMEC, Leuven, Belgium
Keywords :
Circuits; Electric breakdown; Electrostatic discharge; MOSFETs; Optical films; Optical microscopy; Optical pulses; Protection; Stress; Voltage;
Conference_Titel :
SOI Conference, 1992. IEEE International
Conference_Location :
Ponte Vedra Beach, FL
Print_ISBN :
0-7803-7439-8
DOI :
10.1109/SOI.1992.664831
