DocumentCode :
1955387
Title :
Enhancing LRU replacement via phantom associativity
Author :
Feng, Min ; Tian, Chen ; Gupta, Rajiv
Author_Institution :
Dept. of CSE, Univ. of California, Riverside, Riverside, CA, USA
fYear :
2012
fDate :
25-25 Feb. 2012
Firstpage :
9
Lastpage :
16
Abstract :
In this paper, we propose a novel cache design, Phantom Associative Cache (PAC), that alleviates cache thrashing in L2 caches by keeping the in-cache data blocks for a longer time period. To realize PAC, we introduce the concept of phantom lines. A phantom line works like a real cache line in the LRU stack but does not hold any data or tag. When a phantom line is selected for replacement, cache bypassing is performed instead of replacement. By using appropriate number of phantom lines, PAC can always keep the data blocks that show stronger locality longer in the cache and bypass the cache for other blocks. We show that PAC can be implemented reasonably in practice. The experimental results show that on average PAC reduces cache misses by 17.95% for twelve CPU2006 benchmarks with Misses Per Kilo-Instruction (MPKI) larger than 1 and by 6.61% for all CPU2006 and PARSEC benchmarks. With the help of compiler hints, PAC can further reduce cache misses by 22% for benchmarks that have relatively high MPKI or miss rate.
Keywords :
cache storage; content-addressable storage; CPU2006 benchmark; L2 cache; LRU replacement; LRU stack; MPKI; PAC; cache bypassing; cache design; cache misses; cache thrashing; compiler hints; in-cache data block; misses per kilo-instruction; phantom associative cache; phantom associativity; phantom line; real cache line; Benchmark testing; Operating systems; Phantoms; Program processors; Radiation detectors; Registers; Runtime;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Interaction between Compilers and Computer Architectures (INTERACT), 2012 16th Workshop on
Conference_Location :
New Orleans, LA
ISSN :
1550-6207
Print_ISBN :
978-1-4673-2613-1
Type :
conf
DOI :
10.1109/INTERACT.2012.6339621
Filename :
6339621
Link To Document :
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