• DocumentCode
    1955564
  • Title

    Observations of secondary electron emission from diamond films

  • Author

    Bekker, T.L. ; Dayton, J.A., Jr. ; Gilmour, A.S., Jr. ; Krainsky, I.L. ; Rose, M.F. ; Rameshan, R. ; File, D. ; Mearini, G.

  • Author_Institution
    Naval Surface Warfare Center, Port Hueneme, CA, USA
  • fYear
    1992
  • fDate
    13-16 Dec. 1992
  • Firstpage
    949
  • Lastpage
    952
  • Abstract
    Secondary electron yields have been measured at NASA Lewis Research Center on diamond and diamond-like-carbon (DLC) films prepared at Auburn University. These results have been obtained as part of a study initiated by the Naval Surface Warfare Center. Secondary yields as high as 27 have been measured for the diamond films; the DLC films have maximum yields near 1.5. Secondary yields from the diamond films decline when they are subjected to continuous electron bombardment, but emission can be restored or enhanced if the surface is annealed in vacuum or exposed to hydrogen gas.<>
  • Keywords
    annealing; diamond; elemental semiconductors; secondary electron emission; semiconductor thin films; C; H/sub 2/; H/sub 2/ gas exposure; annealing; continuous electron bombardment; diamond films; diamond-like-carbon films; secondary electron emission; Annealing; Diamond; Electron emission; Semiconductor films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1992. IEDM '92. Technical Digest., International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-0817-4
  • Type

    conf

  • DOI
    10.1109/IEDM.1992.307513
  • Filename
    307513