DocumentCode
1955564
Title
Observations of secondary electron emission from diamond films
Author
Bekker, T.L. ; Dayton, J.A., Jr. ; Gilmour, A.S., Jr. ; Krainsky, I.L. ; Rose, M.F. ; Rameshan, R. ; File, D. ; Mearini, G.
Author_Institution
Naval Surface Warfare Center, Port Hueneme, CA, USA
fYear
1992
fDate
13-16 Dec. 1992
Firstpage
949
Lastpage
952
Abstract
Secondary electron yields have been measured at NASA Lewis Research Center on diamond and diamond-like-carbon (DLC) films prepared at Auburn University. These results have been obtained as part of a study initiated by the Naval Surface Warfare Center. Secondary yields as high as 27 have been measured for the diamond films; the DLC films have maximum yields near 1.5. Secondary yields from the diamond films decline when they are subjected to continuous electron bombardment, but emission can be restored or enhanced if the surface is annealed in vacuum or exposed to hydrogen gas.<>
Keywords
annealing; diamond; elemental semiconductors; secondary electron emission; semiconductor thin films; C; H/sub 2/; H/sub 2/ gas exposure; annealing; continuous electron bombardment; diamond films; diamond-like-carbon films; secondary electron emission; Annealing; Diamond; Electron emission; Semiconductor films;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1992. IEDM '92. Technical Digest., International
Conference_Location
San Francisco, CA, USA
ISSN
0163-1918
Print_ISBN
0-7803-0817-4
Type
conf
DOI
10.1109/IEDM.1992.307513
Filename
307513
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