• DocumentCode
    1955690
  • Title

    Ovenized and thermally tunable aluminum nitride microresonators

  • Author

    Kim, Bongsang ; Olsson, Roy H., III ; Wojciechowski, Kenneth E.

  • Author_Institution
    Adv. MEMS Dept., Sandia Nat. Labs., Albuquerque, NM, USA
  • fYear
    2010
  • fDate
    11-14 Oct. 2010
  • Firstpage
    974
  • Lastpage
    978
  • Abstract
    Frequency tuning of aluminum nitride (AlN) microresonators has been demonstrated via localized heating (ovenization) of the resonator. Specifically, piezoelectrically driven 625 MHz microresonators were heated by embedded joule heaters in vacuum. A temperature increase of 135°C was achieved with only 2.8 mW of power consumption. This increase corresponds to ~4500ppm of frequency shift. To minimize heat loss, the devices were suspended from the substrate by high thermal isolation beam type supports. The beams exhibit very high thermal resistance, not only due to their high length to cross-sectional area ratio, but also because they are made of thin-film deposited polycrystalline aluminum nitride. Thin AlN films have been shown to have thermal conductivities that are much lower than that measured in bulk materials. The availability of a power efficient frequency tuning method in aluminum nitride microresonators enables low power ovenization of AlN MEMS-based timing devices and tunable filtering for communication systems.
  • Keywords
    aluminium compounds; microcavities; micromechanical resonators; thermal conductivity; thin films; tuning; AlN; MEMS-based timing devices; aluminum nitride microresonators; embedded joule heaters; frequency 625 MHz; frequency tuning; localized heating; ovenization; polycrystalline aluminum nitride; power 2.8 mW; thermal conductivity; thermal isolation beam; thermal resistance; thermally tunable microresonators; thin film; tunable filtering; Aluminum nitride; Electrical resistance measurement; Electrodes; Heating; Integrated circuit modeling; Resonant frequency; Temperature measurement; aluminum nitride resonator; frequency tuning; oven-based tuning; ovenization; thermal model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2010 IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1948-5719
  • Print_ISBN
    978-1-4577-0382-9
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2010.5935635
  • Filename
    5935635