DocumentCode
1956107
Title
Amorphous selenium based X-ray detectors
Author
Marcovici, Sorb
fYear
2001
fDate
2001
Firstpage
193
Lastpage
196
Abstract
A novel, simpler, competing technology was developed to detect X-ray quanta by a "direct conversion" process from X-ray to electrical charge. Although there are several photoconductor materials with promising characteristics, amorphous selenium has proven so far to have the most appealing combination of characteristics suitable for high resolution X-ray detection. The paper will introduce the basic operating principles of an innovative, amorphous selenium based, X-ray detector developed and manufactured by ANRAD Corporation, a Canadian wholly owned subsidiary of Analogic Corporation, Peabody, MA
Keywords
X-ray detection; amorphous semiconductors; elemental semiconductors; nondestructive testing; radiology; selenium; ANRAD Corporation; Se; X-ray detectors; direct conversion process; high resolution detection; operating principles; Amorphous materials; Dynamic range; Electrodes; Object detection; Photoconducting materials; Photodetectors; Radiology; Spatial resolution; X-ray detection; X-ray detectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Sensors for Industry, 2001. Proceedings of the First ISA/IEEE Conference
Conference_Location
Rosemont, IL
Print_ISBN
0-7803-6659-X
Type
conf
DOI
10.1109/SFICON.2001.968528
Filename
968528
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