• DocumentCode
    1956236
  • Title

    A Multi-stage Fault-Tolerant Multiplier with Triple Module Redundancy (TMR) Technique

  • Author

    Ping-Yeh Yin ; Yuan-Ho Chen ; Chih-Wen Lu ; Shian-Shing Shyu ; Chung-Lin Lee ; Ting-Chia Ou ; Yo-Sheng Lin

  • Author_Institution
    Dept. of Electr. Eng., Nat. Chi Nan Univ., Nantou, Taiwan
  • fYear
    2013
  • fDate
    29-31 Jan. 2013
  • Firstpage
    636
  • Lastpage
    641
  • Abstract
    This study proposes a multistage fault-tolerant (MSFT) scheme for fixed-width array multipliers. The proposed MSFT multipliers divide the array multiplier into multiple stages, and implement a single processing element (PE) by regarding multiple computation cycles to achieve a low area design. To tolerate the fault that occurs in the integrated circuit, three redundancy replicas of PE (TMR-PE) architecture are proposed. Thus, the MSFT multiplier employs the TMR-PEs to achieve a low-cost fault-tolerant design. The TMR-PEs are designed by using compressors with multiple operands, such as 4-2 compressors or other compressors with more operands, to reduce computation cycles and speed up the execution time. Because of implementation with a 0:18-um CMOS process, the long word-length MSFT multiplier saves a significant amount of the circuit area. The proposed 64 × 64 MSFT multiplier has only 13% of the circuit area and 3% of the delay overhead of the original multiplier. Based on the measurements of the area-delay product (AT) metric, the value of the 64 x 64 MSFT multiplier is only 0:21 fold of the value of the original multiplier. Consequently, the proposed MSFT multipliers achieve a low-cost fault-tolerant design.
  • Keywords
    CMOS integrated circuits; fault tolerance; multiplying circuits; CMOS process; MSFT multipliers; PE architecture; area delay product metric; fault tolerant design; fixed width array multipliers; integrated circuit; multiple operands; multistage fault tolerant multiplier; redundancy replicas; single processing element; triple module redundancy technique; Arrays; Circuit faults; Compressors; Delays; Fault tolerance; Fault tolerant systems; Tunneling magnetoresistance; Fixed-width array multiplier; Multistage faulttolerant (MSFT) multiplier; Triple module redundancy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Systems Modelling & Simulation (ISMS), 2013 4th International Conference on
  • Conference_Location
    Bangkok
  • ISSN
    2166-0662
  • Print_ISBN
    978-1-4673-5653-4
  • Type

    conf

  • DOI
    10.1109/ISMS.2013.45
  • Filename
    6498349