Title :
Origins and mitigation of spurious modes in aluminum nitride microresonators
Author :
Olsson, Roy H., III ; Wojciechowski, Kenneth E. ; Branch, Darren W.
Author_Institution :
Adv. MEMS Dept., Sandia Nat. Labs., Albuquerque, NM, USA
Abstract :
Recently reported narrow bandwidth, <;2%, aluminum nitride microresonator filters in the 100-500 MHz range offer lower insertion loss, 100× smaller size, and elimination of large external matching networks, when compared to similar surface acoustic wave filters. While the initial results are promising, many microresonators exhibit spurious responses both close and far from the pass band which degrade the out of band rejection and prevent the synthesis of useful filters. This paper identifies the origins of several unwanted modes in overtone width extensional aluminum nitride microresonators and presents techniques for mitigating the spurious responses.
Keywords :
aluminium compounds; band-pass filters; microcavities; micromechanical resonators; surface acoustic wave filters; AlN; aluminum nitride; frequency 100 MHz to 500 MHz; matching networks; microresonator filters; passband filters; spurious modes; surface acoustic wave filters; Acoustic waves; Electrodes; Filter banks; Microcavities; Resonant frequency; Resonator filters; Substrates; Aluminum Nitride; Microresonator; RF MEMS; Spurious Mode;
Conference_Titel :
Ultrasonics Symposium (IUS), 2010 IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4577-0382-9
DOI :
10.1109/ULTSYM.2010.5935667