DocumentCode
1956377
Title
Origins and mitigation of spurious modes in aluminum nitride microresonators
Author
Olsson, Roy H., III ; Wojciechowski, Kenneth E. ; Branch, Darren W.
Author_Institution
Adv. MEMS Dept., Sandia Nat. Labs., Albuquerque, NM, USA
fYear
2010
fDate
11-14 Oct. 2010
Firstpage
1272
Lastpage
1276
Abstract
Recently reported narrow bandwidth, <;2%, aluminum nitride microresonator filters in the 100-500 MHz range offer lower insertion loss, 100× smaller size, and elimination of large external matching networks, when compared to similar surface acoustic wave filters. While the initial results are promising, many microresonators exhibit spurious responses both close and far from the pass band which degrade the out of band rejection and prevent the synthesis of useful filters. This paper identifies the origins of several unwanted modes in overtone width extensional aluminum nitride microresonators and presents techniques for mitigating the spurious responses.
Keywords
aluminium compounds; band-pass filters; microcavities; micromechanical resonators; surface acoustic wave filters; AlN; aluminum nitride; frequency 100 MHz to 500 MHz; matching networks; microresonator filters; passband filters; spurious modes; surface acoustic wave filters; Acoustic waves; Electrodes; Filter banks; Microcavities; Resonant frequency; Resonator filters; Substrates; Aluminum Nitride; Microresonator; RF MEMS; Spurious Mode;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium (IUS), 2010 IEEE
Conference_Location
San Diego, CA
ISSN
1948-5719
Print_ISBN
978-1-4577-0382-9
Type
conf
DOI
10.1109/ULTSYM.2010.5935667
Filename
5935667
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