• DocumentCode
    1956377
  • Title

    Origins and mitigation of spurious modes in aluminum nitride microresonators

  • Author

    Olsson, Roy H., III ; Wojciechowski, Kenneth E. ; Branch, Darren W.

  • Author_Institution
    Adv. MEMS Dept., Sandia Nat. Labs., Albuquerque, NM, USA
  • fYear
    2010
  • fDate
    11-14 Oct. 2010
  • Firstpage
    1272
  • Lastpage
    1276
  • Abstract
    Recently reported narrow bandwidth, <;2%, aluminum nitride microresonator filters in the 100-500 MHz range offer lower insertion loss, 100× smaller size, and elimination of large external matching networks, when compared to similar surface acoustic wave filters. While the initial results are promising, many microresonators exhibit spurious responses both close and far from the pass band which degrade the out of band rejection and prevent the synthesis of useful filters. This paper identifies the origins of several unwanted modes in overtone width extensional aluminum nitride microresonators and presents techniques for mitigating the spurious responses.
  • Keywords
    aluminium compounds; band-pass filters; microcavities; micromechanical resonators; surface acoustic wave filters; AlN; aluminum nitride; frequency 100 MHz to 500 MHz; matching networks; microresonator filters; passband filters; spurious modes; surface acoustic wave filters; Acoustic waves; Electrodes; Filter banks; Microcavities; Resonant frequency; Resonator filters; Substrates; Aluminum Nitride; Microresonator; RF MEMS; Spurious Mode;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2010 IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1948-5719
  • Print_ISBN
    978-1-4577-0382-9
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2010.5935667
  • Filename
    5935667